Characterization, when used in materials science, refers to the use of
external techniques to probe into the internal structure and properties of a material. Characterization can take the form of
actual materials testing, or analysis, for example in some form of
Analysis
Analysis techniques are used simply to magnify the specimen, to visualise its internal structure, and to gain knowledge as to the distribution of elements within the specimen and their interactions.
Magnification and internal visualisation are normally done in a type of microscope, such as:
Optical Microscope - Scanning Electron Microscope (SEM)
- Transmission Electron Microscope (TEM)
- Field Ion Microscope (FIM)
- Scanning Tunneling Microscope (STM)
- Atomic Force Microscope (AFM)
Elemental analysis of the specimen can also be done in a number of ways:
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