Steve Marsh has written:

'Practical MMIC design' -- subject(s): Microwave integrated circuits, Design and construction

Richard Q. Lee has written:

'A design conceot for an MMIC microstrip phased array' -- subject(s): Microwave integrated circuits

'Swept frequency technique for dispersion measurement of microstrip lines' -- subject(s): Dispersion, Measurement

'Absolute gain measurement by the image method under mismatched condition' -- subject(s): Antennas (Electronics)

We cannot create better artificial intelligence because the right technology is not there.

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Creating sometime as powerful as the human brain is currently very difficult. But recent advancements have promised a brighter future. The circuitory system is not even 1% close to our brain's. We can process so much information at once that it makes it very difficult for us to mmic that in machines. That is why different companies are aiming at different operations like Honda's ASIMO is aimed at movements. Now after even producing a complex circuitory system as our brain there still remains the judicial use of its powers producing a system which could have emotions. Does this sum up to your question?.

Kurt A. Shalkhauser has written:

'Rain-fade simulation and power augmentation for satellite communication systems' -- subject(s): Artificial satellites in telecommunication

'Bit-error-rate testing of high-power 30-GHz traveling wave tubes for ground-terminal applications' -- subject(s): Communication systems, Astronautics, Bit error rate, Traveling wave tubes

'Bit-error-rate testing of fiber optic data links for MMIC-based phased array antennas' -- subject(s): Phased array antennas, Data links, Digital data, Bit error rate, Fiber optics, Phased arrays

'High-performance packaging for monolithic microwave and millimeter-wave integrated circuits' -- subject(s): Phased array antennas, Microwave integrated circuits

Reference the two definitions given below, one from IEEE and the other from US Army research document. Web links are found after each....

The use of cold FET measurements solves the problem

of junction heating and ANA protection. By 'cold', it is

meant that either Vgs = 0 or Vds = 0, and so a zero DC

drain current flows. Under these conditions, destructive

oscillations are prevented. Also, with the heat dissipation

equal to zero, the entire device merely has to be maintained

at the required measurement temperature. A disadvantage

of cold FET measurements is that the device is

measured under voltage and current conditions far

removed from those under which it will operate. Information

about the device is therefore lost. For example, some

nonlinear elements within a MOSFET show a current

dependence, which cannot be determined from cold

measurements.

The design of monolithic microwave integrated circuits (MMIC) is dependent on the ability to generate accurate device

models. Prior knowledge of the external parasitic components is required to determine the small-signal model of the intrinsic

device. In this report, we describe a technique and its implementation for extracting external device parasitics. The term cold

field-effect transistor (FET) refers to measurements taken when the drain is at the same voltage as the source.