x-ray spectrometry

n.
The use of an x-ray spectrometer, especially for chemical analysis of a substance.

A rapid and economical technique for quantitative analysis of the elemental composition of specimens. It differs from x-ray diffraction, whose purpose is the identification of crystalline compounds. It differs from spectrometry in the visible region of the spectrum in that the x-ray photons have energies of thousands of electronvolts and come from tightly bound inner-shell electrons in the atoms, whereas visible photons come from the outer electrons and have energies of only a few electronvolts.

In x-ray spectrometry the irradiation of a sample by high-energy electrons, protons, or photons ionizes some of the atoms, which then emit characteristic x-rays whose wavelength depends on the atomic number of the element, and whose intensity is related to the concentration of that element. Generally speaking, the characteristic x-ray lines are independent of the physical state (solid or liquid) and of the type of compound (valence) in which an element is present, because the x-ray emission comes from inner, well-shielded electrons in the atom.See also Auger effect.

X-ray spectrometry generally does not require any separation of elements before measuring, because the x-ray lines are easily resolved. However, preconcentration methods are sometimes useful as a means for improving the limit of detection. One limitation of x-ray spectrometry is the progressive difficulty of measurement below atomic number 11. See also Spectroscopy.

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