A cathode ray tube
SEM
15 jan 100% but displayed on internet
image processing
A scanning electron microscope (SEM) is a type of microscope that gives a three-dimensional view of the specimen by scanning the surface with a focused beam of electrons. The image produced by an SEM provides detailed topographical information of the specimen's surface.
first it was said it will displayed on 14 feb bt nw it is said that it will displayed on 19 feb no confirmation
A scanning electron microscope (SEM) creates an image of the surface by scanning a focused electron beam across the sample surface. The interaction between the electrons and the sample generates signals that are used to create a detailed image of the surface morphology at high resolutions.
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scanning electron microscope (SEM). It creates an image by detecting secondary electrons emitted from the sample surface when a focused electron beam is scanned across it. The SEM can provide high-resolution, detailed images of the sample's surface topography and composition.
No, a scanning electron microscope (SEM) produces 2D images. However, by acquiring a series of 2D images at different angles and reconstructing them using specialized software, a 3D image can be generated.
1.SEM samples require minimal preparation 2 Data is generated in digital form 3 SEM is easy to operate and user friendly 4 It produces image in 3-dimension which gives precise information about the specimen
Transmission electron microscopes (TEM) use a beam of electrons transmitted through a thin sample to create an image, while scanning electron microscopes (SEM) use a beam of electrons scanned across the surface of a sample to create an image. TEM provides higher resolution images of internal structures, while SEM provides detailed surface images.
Transmission electron microscopes (TEM) transmit electrons through a thin sample to create a detailed image of its internal structure, while scanning electron microscopes (SEM) scan a focused beam of electrons across the surface of a sample to create a 3D image of its topography. TEM is used for detailed imaging of internal structures at a nanometer scale, while SEM is used for surface imaging and analysis.