What is the working principle of AFM?

Answer 1

Atomic Force Microscopy (AFM) operates by scanning a sharp tip attached to a flexible cantilever over a sample's surface. As the tip approaches the surface, interatomic forces between the tip and the sample cause the cantilever to deflect. This deflection is measured using a laser beam reflected off the cantilever, allowing for the creation of high-resolution topographical images at the nanoscale. AFM can operate in various modes, including contact, non-contact, and tapping, depending on the desired imaging conditions.