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Transmission electron microscopy (TEM) and scanning electron microscopy (SEM) are both techniques used to visualize samples at high magnifications, but they differ in their approach. TEM transmits electrons through a thin specimen, providing detailed images of internal structures at the atomic level. In contrast, SEM scans the surface of a specimen with focused electrons, producing three-dimensional images of surface topography and composition. Consequently, TEM is better for internal structural analysis, while SEM is ideal for examining surface features.

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