The ability test that preceded the development of the Binet scale was the Simon-Binet test, developed by Alfred Binet and Theodore Simon in 1905. This test assessed children's intelligence through a series of questions and tasks.
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The Stanford-Binet intelligence scale is an updated version of the original Binet-Simon scale, developed by Lewis Terman at Stanford University. Terman revised and expanded the original scale to include a wider range of age groups and standardized it for the American population. The Stanford-Binet scale is still used today to assess cognitive abilities in individuals.
Alfred Binet did not win any major awards during his lifetime. He is best known for his work on intelligence testing, specifically the development of the Binet-Simon Scale which laid the foundation for modern IQ tests.
The Stanford-Binet Intelligence Test was introduced by Lewis Terman in 1916. He adapted the original Binet-Simon Intelligence Scale to create the Stanford-Binet, which became one of the most widely used intelligence tests in the world.
Lewis Terman adapted the Binet-Simon Intelligence Test for American use and established norms for the test, which later became known as the Stanford-Binet Intelligence Scale.
Alfred Binet and Theodore Simon are credited with developing the first useful individual test of intelligence, known as the Binet-Simon Scale in 1905. This assessment aimed to measure a child's mental age compared to their chronological age and was intended to identify students who needed special assistance in school.