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Atomic Force Microscopes (AFM) and Scanning Tunneling Microscopes (STM) are different types of Scanning Probe Microscopes (SPM). An AFM uses a sharp, microfabricated tip on a flexible cantilever (typically made of silicon) to scan over a surface and measure topography. An AFM uses the atomic forces between the tip and surface, hence its name. An AFM can work by simply "dragging" the tip across the surface or by oscillating the cantilever and sensing changes in the cantilever's amplitude.

An STM, on the other hand, uses a tunneling current to sense the surface. The surface has to be at least somewhat conductive. The tip is typically a cut or etched wire made of Pt or Tungsten. Because the tunneling current drops off exponentially with distance, very accurate measurements can be made.


The STM was the original scanning probe microscope invented. The AFM came afterwards to overcome the conductivity requirements of the STM.

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Q: Difference between atomic force microscope and scanning tunnel microscope?
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