Watts has written: 'Point defects in crystals' -- subject(s): Crystals, Defects
crystalline defets are present in a crystal due to the presence of impurities.
Crystals with line defects are thermally unstable as its ethalpy change increases more than its entropy change. This leads to an increased in Gibbs free energy.
Any change in the configuration of the lattice of the crystal which causes the crystal structure to deviate from the ideal structure is called a crystal structure. It is of the following types - Point defects Line defects Surface defects volume defects
when something cools more slowly the crystals are larger. Therefore it is harder and less easy to break. Slowly grown crystals also are less prone to defects in their structure.
Lewis T. Chadderton has written: 'Nucleation of damage centres during ion implantation of silicon' -- subject(s): Crystals, Defects, Nucleation, Silicon crystals 'Fission damage in crystals' -- subject(s): Crystals, Effect of radiation on, Nuclear fission
Within a crystal there are point defects and line defects; point defects are missing or extra lattice points within the crystal lattice (vacancies or interstitials), line defects may be due to an 'extra' half lattice plane within the crystal. The end of a line defect plane is known as an edge dislocation, screw dislocations occur where part of a crystal is displaced over one lattice direction and is therefore twisted. Dislocation loops can occur where an edge and a screw dislocation intersect.
A. P. Zhernov has written: 'Metally s nemagnitnymi primesnymi atomami' -- subject(s): Defects, Metal crystals, Physical metallurgy
well crystals like quartz grow under extreme pressure and heat but impurities like other colors are caused by trace impurities of other elements such as zinc, copper, aluminium, titanium and a couple others.
R. L. Snyder has written: 'Defect and microstructure analysis by diffraction' -- subject(s): Analysis, Crystals, Defects, Diffraction, X-ray crystallography
Defects.
Latent defects are not obvious and are not easily discoverable while patent defects are obvious.