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A Scanning Electron Microscope of SEM is a type of electron microscope that images a surface with high-energy electrons. These electrons interact with the atoms in the sample to produce signals that relate to the sample's surface topology and electrical composition. The main advantages of a SEM vs a typical light microscope - are the very large increase in overall resolution, generally hundreds of times great than what is possible with a light microscope. Also the exceptionally deep depth of field that allows one to display an almost 3 dimensional image, that allows one to study the surface structure of the sample.

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