KLOC = Kilo Lines Of Code
Defect Density = Number of Defects / KLOC
For e.g. Defects found = 15
Lines of code = 2,500 = 2.5 KLOC
Defect Density = 15 / 2.5 = 6 Defects/KLOC
Izabela Kloc was born on May 8, 1963.
Izabela Kloc was born on May 8, 1963.
Izabela Kloc is 48 years old (birthdate: May 8, 1963).
The formula for residual defect density in QA is: Residual Defect Density = (Number of defects remaining after a phase / Size of the phase). It is used to measure the effectiveness of defect removal in a particular phase of the software development process.
Defect density is a metric used to measure the number of defects (bugs, errors) present in a software product or system per unit of size, such as lines of code or function points. It helps in assessing the quality of the software and identifying areas that may need improvement. A higher defect density indicates a higher likelihood of issues and may require additional testing and debugging efforts.
You can use the defect density metric to track the number of defects found over a period of time. Defect density is calculated by dividing the total number of defects by the size of the software, usually measured in lines of code or function points. This metric helps in identifying trends in defect discovery and can inform quality improvement efforts.
In the frenkel defect the ions are not removed from the crystal.so there will be no change in the crystal structure. that is there is no decrease in the no of ions.all the ions are inside the crystal.they are only dislocated.
Kilo Lines Of Code i.e 1000 lines of code of a program
K. Heggestad has written: 'Electrical Conductivity, Defect Structure and Density in the Ceria-Gadolinia System'
Effort Applied = ab(KLOC)bbDevelopment Time = cb(Effort Applied)db [months]People required = Effort Applied / Development Time [count]KLoC- estimated number of thousands of delivered lines of code for the projectai, bi areSoftware projectaibiOrganic3.21.05Semi-detached3.01.12Embedded2.81.20
Effort Applied = ab(KLOC)bbDevelopment Time = cb(Effort Applied)db [months]People required = Effort Applied / Development Time [count]KLoC- estimated number of thousands of delivered lines of code for the projectai, bi areSoftware projectaibiOrganic3.21.05Semi-detached3.01.12Embedded2.81.20
1).schottky defect arises due to departue of ions (both cation and anion in equal ratio) from crystal lattice leaving holes that favour conductivity. The equal no of ions depart because to maintain the electrical neutrality of crystal. It was discovered by walter.H schottky in 1930. But in frenkel defect ions(cations) are missing from there normal lattice site and occupying an interstitial site between the lattice points. They dont depart from crystal lattice. Because no departure occure so crystal remain electrically neutral. It was discovered by Yakov frenkel in 1926. 2) schottky defect is only vacancy defect but frenkel defect is vacancy as well as interstitial defect. 3). Schottky defect decreases density and strength of the crystal. But frenkel defect doesnt affect density. 4).schottky defect is shown by the ionic solids having high coordination no and approx. same size of cation and anion(i.e r+ve/r-ve approaches to 1) While frenkel defect is shown by the compound having low coordination no and size of anion larger than cation(i.e r+ve/r-ve approches the minimum value). By Sandeep Singh Lingwal Srinagar, Uttrakhand