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Reference the two definitions given below, one from IEEE and the other from US Army research document. Web links are found after each....

The use of cold FET measurements solves the problem

of junction heating and ANA protection. By 'cold', it is

meant that either Vgs = 0 or Vds = 0, and so a zero DC

drain current flows. Under these conditions, destructive

oscillations are prevented. Also, with the heat dissipation

equal to zero, the entire device merely has to be maintained

at the required measurement temperature. A disadvantage

of cold FET measurements is that the device is

measured under voltage and current conditions far

removed from those under which it will operate. Information

about the device is therefore lost. For example, some

nonlinear elements within a MOSFET show a current

dependence, which cannot be determined from cold

measurements.

The design of monolithic microwave integrated circuits (MMIC) is dependent on the ability to generate accurate device

models. Prior knowledge of the external parasitic components is required to determine the small-signal model of the intrinsic

device. In this report, we describe a technique and its implementation for extracting external device parasitics. The term cold

field-effect transistor (FET) refers to measurements taken when the drain is at the same voltage as the source.

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